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Photoinduced and Thermal Single‐Electron Transfer to Generate Radicals from Frustrated Lewis Pairs Article
Chem. Eur. J., 26(41), 9005-9011.F. Holtrop (Flip), A.R. Jupp (Andrew), N.P. van Leest (Nicolaas), M. Paradiz Dominguez (Maximilian), R.M. Williams (René), A.M. Brouwer (Albert), B. de Bruin (Bas), A.W. Ehlers (Andreas) and J.C. Slootweg (Chris)
July 2020
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Detection of hidden gratings through multilayer nanostructures using light and sound Article
Phys. Rev. Appl., 14(1), 014015-1-16.S. Edward (Stephen), H. Zhang (Hao), I. Setija (Irwan), V. Verrina (Vanessa), A. Antoncecchi (Alessandro), S. Witte (Stefan) and P.C.M. Planken (Paul)
July 2020
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Time- and space-resolved optical Stark spectroscopy in the afterglow of laser-produced tin-droplet plasma Article
Phys. Rev. E, 102(1), 013204: 1-9.J. Scheers (Joris), R. Schupp (Ruben), R.A. Meijer (Randy Anthonius), W.M.G. Ubachs (Wim), R. Hoekstra (Ronnie) and O.O. Versolato (Oscar)
July 2020
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Laser-induced ultrasonics for detection of low-amplitude grating through metal layers with finite roughness Article
Optics Express, 28(16), 23374-23387.S. Edward (Stephen), H. Zhang (Hao), S. Witte (Stefan) and P.C.M. Planken (Paul)
July 2020
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Proton-electron mass ratio from laser spectroscopy of HD+ at the part-per-trillion level Article
Science, 369(6508), 1238-1241.S. Patra (Sayan), M. Germann, J.-Ph. Karr, M. Haidar, L. Hilico, V.I. Korobov, F. M. J. Cozijn, K.S.E. Eikema (Kjeld), W.M.G. Ubachs (Wim) and J.C.J. Koelemeij
July 2020 -
Photoacoustic detection of low duty cycle gratings through optically opaque layers Article
Appl. Phys. Lett., 117(5), 051104: 1-6.V. Verrina (Vanessa), S. Edward (Stephen), H. Zhang (Hao), S. Witte (Stefan) and P.C.M. Planken (Paul)
August 2020
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EUV spectroscopy of Sn5-Sn10+ions in an electron beam ion trap and laser-produced plasmas Article
J. Phys. B: At. Mol. Opt. Phys., 53(19), 195001: 1-11.Z. Bouza (Zoi), J. Scheers (Joris), A.N. Ryabtsev (Alexander), R. Schupp (Ruben), L. Behnke (Lars), C. Shah (Chintan), J. Sheil (John), M. Bayraktar (Muharrem), J.R. Crespo López-Urrutia, W.M.G. Ubachs (Wim), et al. R. Hoekstra (Ronnie) and O.O. Versolato (Oscar)
August 2020
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Uncertainty estimation and design optimization of 2D diffraction-based overlay metrology targets Article
ACS Photonics, 7(10), 2765-2777.R. Röhrich (Ruslan), G. Oliveri (Giorgio), S. Kovaios (Stefanos), V.T. Tenner (Vasco), A.J. den Boef (Arie), J.T.B. Overvelde (Johannes) and A.F. Koenderink (Femius)
August 2020