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Dual-tone Application of a Tin-Oxo Cage Photoresist Under E-beam and EUV Exposure Article
J. Photopolymer. Sci.Tec., 31(2), 249-255.Y. Zhang (Yu), J. Haitjema (Jarich), M. Baljozovic (Milos), M. Vockenhuber (Michaela), D. Kazazis, T. Jung, Y. Ekinci (Yasin) and A.M. Brouwer (Albert)
May 2018
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The ultrafast X-ray spectroscopic revolution in chemical dynamics Article
Nat. Rev. Chem., 2(6), 82-94.P.M. Kraus (Peter), M. Zürch (Michael), S.K. Cushing (Scott), D.M. Neumark (Daniel) and S.R. Leone (Stephen)
May 2018 -
Laser-to-droplet alignment sensitivity relevant for laser-produced plasma sources of extreme ultraviolet light Article
J. Appl. Phys., 124(1), 013102: 1-7.S.A. Reijers, D. Kurilovich (Dmitry), F. Torretti (Francesco), H. Gelderblom (Hanneke) and O.O. Versolato (Oscar)
July 2018 -
Formation of a monolayer h-BN nanomesh on Rh (111) studied using in-situ STM Article
Sci. China-Phys. Mech. Astron., 61(7), 076811: 1-6.July 2018 -
Controlling ion kinetic energy distributions in laser produced plasma sources by means of a picosecond pulse pair Article
J. Appl. Phys., 124(5), 053303: 1-7.A. Stodolna, T. de Faria Pinto (Tiago), F. Ali, A. Bayerle (Alex), D. Kurilovich (Dmitry), J. Mathijssen (Jan), R. Hoekstra (Ronnie), O.O. Versolato (Oscar), K.S.E. Eikema (Kjeld) and S. Witte (Stefan)
August 2018
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Hot phonon and carrier relaxation in Si(100) determined by transient extreme ultraviolet spectroscopy Article
Struct. Dyn., 5(5), 054302: 1-21.S.K. Cushing (Scott), M. Zürch (Michael), P.M. Kraus (Peter), L.M. Carneiro (Lucas), A. Lee (Angela), H.-T. Chang (Hung-Tzu), C.J. Kaplan (Christopher) and S.R. Leone (Stephen)
September 2018
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Detection of periodic structures through opaque metal layers by optical measurements of ultrafast electron dynamics Article
Opt. Express, 26(18), 23380-23396.S. Edward (Stephen), A. Antoncecchi (Alessandro), H. Zhang (Hao), H.J. Sielcken (Harmen), S. Witte (Stefan) and P.C.M. Planken (Paul)
September 2018
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Quantifying single plasmonic nanostructure far -fields with interferometric and polarimetric k-space microscopy Article
Light : Sci. Appl., 65: 1-11.R. Röhrich (Ruslan), C. Hoekmeijer (Chris), C.I. Osorio (Clara) and A.F. Koenderink (Femius)
September 2018