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Breaking Abbe’s diffraction limit with harmonic deactivation microscopy Article
Sci. Adv., 10(46), eadp3056: 1-8.K. Murzyn (Kevin), M.L.S. van der Geest (Maarten), L. Guery (Leo), Z. Nie (Zhonghui), P. van Essen (Pieter), S. Witte (Stefan) and P.M. Kraus (Peter)
November 2024
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Coverage-Dependent Stability of RuxSiy on Ru(0001): A Comparative DFT and XPS Study Article
Phys. Chem. Chem. Phys., 26(46), 28793-28799.J. Cottom (Jonathon), S. van Vliet (Stefan), J. Meyer (Jörg), R. Bliem (Roland) and E. Olsson (Emilia)
November 2024
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Enhancing diffraction-based overlay metrology capabilities in digital holographic microscopy using model-based signal separation Article
J. Micro/Nanopattern. Mater. Metrol., 23(4), 044006: 1-14.T. van Gardingen-Cromwijk (Tamar), S.G.J. Mathijssen (Simon), M. Noordam (Marc), S. Witte (Stefan), J.F. de Boer (Johannes) and A.J. den Boef (Arie)
November 2024
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Nanometer Interlaced Displacement Metrology Using Diffractive Pancharatnam-Berry and Detour Phase Metasurfaces Article
ACS PhotonicsN. Feldman (Nick), K.M.M. Goeloe (Kian), A.J. den Boef (Arie), L.V. Amitonova (Lyubov) and A.F. Koenderink (Femius)
November 2024
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Bridging the gap between high-entropy alloys and metallic glasses: Control over disorder and mechanical properties of coatings Article
Mater. Today Commun., 110604: 1-10.A. Troglia (Alessandro), C. Leriche (Cyrian), M.L. van de Poll (Mike), C. Morsche (Christoph), G.H. ten Brink (Gert), B.J. Kooi (Bart), B. Weber (Bart) and R. Bliem (Roland)
December 2024
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Speckle-based 3D sub-diffraction imaging of sparse samples through a multimode fiber Article
APL Photonics, 9(12), 126104: 1-10.Z. Lyu (Zhouping), S.-T. Hung (Shih-Te), C.S. Smith (Carlas) and L.V. Amitonova (Lyubov)
December 2024
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December 2024
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Plasma sources for advanced semiconductor applications Article
Appl. Phys. Lett., 125(23), 230401: 1-9.O.O. Versolato (Oscar), I. Kaganovich (Igor), K. Bera (Kallol), T. Lill (Thorsten), H.-C. Lee (Hyo-Chang), R. Hoekstra (Ronnie), J. Sheil (John) and S.K. Nam (Sang Ki)
December 2024