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Enhancing diffraction-based overlay metrology capabilities in digital holographic microscopy using model-based signal separation Article
J. Micro/Nanopattern. Mater. Metrol., 23(4), 044006: 1-14.T. van Gardingen-Cromwijk (Tamar), S.G.J. Mathijssen (Simon), M. Noordam (Marc), S. Witte (Stefan), J.F. de Boer (Johannes) and A.J. den Boef (Arie)
November 2024
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Nanometer Interlaced Displacement Metrology Using Diffractive Pancharatnam-Berry and Detour Phase Metasurfaces Article
ACS Photonics, 11(12), 5229-5238.N. Feldman (Nick), K.M.M. Goeloe (Kian), A.J. den Boef (Arie), L.V. Amitonova (Lyubov) and A.F. Koenderink (Femius)
November 2024
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Speckle-based 3D sub-diffraction imaging of sparse samples through a multimode fiber Article
APL Photonics, 9(12), 126104: 1-10.Z. Lyu (Zhouping), S.-T. Hung (Shih-Te), C.S. Smith (Carlas) and L.V. Amitonova (Lyubov)
December 2024
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Bridging the gap between high-entropy alloys and metallic glasses: Control over disorder and mechanical properties of coatings Article
Mater. Today Commun., 110604: 1-10.A. Troglia (Alessandro), C. Leriche (Cyrian), M.L. van de Poll (Mike), C. Morsche (Christoph), G.H. ten Brink (Gert), B.J. Kooi (Bart), B. Weber (Bart) and R. Bliem (Roland)
December 2024
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December 2024
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Plasma sources for advanced semiconductor applications Article
Appl. Phys. Lett., 125(23), 230401: 1-9.O.O. Versolato (Oscar), I. Kaganovich (Igor), K. Bera (Kallol), T. Lill (Thorsten), H.-C. Lee (Hyo-Chang), R. Hoekstra (Ronnie), J. Sheil (John) and S.K. Nam (Sang Ki)
December 2024
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High-resolution Imaging Through a Multimode Fiber: From Raster-scanning to Compressive Sensing Dissertation
Computational ImagingDecember 2024 -
Sub-ablation-threshold light-induced modification of thin ruthenium layers detected using optical reflectance Article
J. Appl. Phys., 136(24), 245305: 1-14.E. Abram (Ester), N. Orlov (Nikolai), E.C. Garnett (Erik) and P.C.M. Planken (Paul)
December 2024