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    Secondary electron emission yield measurements of dielectrics based on a novel collector-only method Article

    Nucl. Instrum. Methods. Phys. Res., Sect B, 6-11.

    van Eden (Gustaaf), D. Verheijde (Duncan) and J. Verhoeven (Jan)

    January 2022
    open access
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    Direct Patterning of CsPbBr3 Nanocrystals via Electron-Beam Lithography Article

    ACS Appl. Energy Mater., 5(2), 1672-1680.

    C.D. Dieleman (Christian), J.S. van den Burgt (Julia), N. Thakur (Neha), E.C. Garnett (Erik) and B. Ehrler (Bruno)

    January 2022
    open access
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    Advances in laboratory-scale ptychography using high harmonic sources [Invited] Review

    L. Loetgering (Lars), S. Witte (Stefan) and J. Rothhardt (Jan)

    January 2022
    open access
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    Enhanced Generation and Detection of Ultrafast Laser-Induced Acoustic Signals Dissertation

    Light-Matter Interaction

    G. de Haan (Guido)

    January 2022
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    Plasmonic enhancement of photoacoustic strain-waves on gold gratings Article

    AIP Advances, 12(2), 025227: 1-8.

    G. de Haan (Guido), E. Abram (Ester), T.J. van den Hooven (Thomas) and P.C.M. Planken (Paul)

    February 2022
    open access
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    Cross-calibration of a combined electrostatic and time-of-flight analyzer for energy- and charge-state-resolved spectrometry of tin laser-produced plasma Article

    Appl. Phys. B- Lasers O, 128(3), 39: 1-11.

    L. Poirier (Lucas), A. Bayerle (Alex), A.C. Lassise (Adam), F. Torretti (Francesco), R. Schupp (Ruben), L. Behnke (Lars), Y. Mostafa (Yahia), W.M.G. Ubachs (Wim), O.O. Versolato (Oscar) and R. Hoekstra (Ronnie)

    February 2022
    open access
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    Fluorine-Rich Zinc Oxoclusters as Extreme Ultraviolet Photoresists: Chemical Reactions and Lithography Performance Article

    ACS Mater. Au, 2(3), 343-355.

    N. Thakur (Neha), M. Vockenhuber (Michaela), Y. Ekinci (Yasin), B. Watts (Benjamin), A. Giglia (Angelo), N. Mahne (Nicola), S. Nannarone (Stefano), S. Castellanos Ortega (Sonia) and A.M. Brouwer (Albert)

    February 2022
    open access
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    Diffraction-based overlay metrology from visible to infrared wavelengths using a single sensor Article

    J. Micro/Nanopattern. Mater. Metrol., 21(1), 014001: 1-10.

    T.T.M. van Schaijk (Theodorus), C. Messinis (Christos), N. Pandey (Nitesh), A. Koolen (Armand), S. Witte (Stefan), J.F. de Boer (Johannes) and A.J. den Boef (Arie)

    February 2022
    open access
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