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Study of the humidity-controlled CeO2 fixed-abrasive chemical mechanical polishing of a single crystal silicon wafer Article
Tribol.Int., 108087: 1-13.G.Z. Li (Gengzhuo), C. Xiao (Chen), S. Zhang (Shibo), S. Luo (Shengquan), Y. Chen (Yuhan) and Y. Wu (Yongbo)
February 2023 -
Why Teflon is so slippery while other polymers are not Article
Phys. Rev. E, 107(2), 024801: 1-6.T.-D. Terwisscha-Dekker (Hans), T. Hogenelst (Tadeus), R. Bliem (Roland), B. Weber (Bart) and D. Bonn (Daniel)
February 2023 -
High-resolution wavefront sensing and aberration analysis of multi-spectral extreme ultraviolet beams Article
Optica, 10(2), 255-263.M. Du (Mengqi), X. Liu (Xiaomeng), A. Pelekanidis (Antonios), F. Fengling (Fengling), L. Loetgering (Lars), P. Konold (Patrick), C.L. Porter (Christina), P. Smorenburg (Peter), K.S.E. Eikema (Kjeld) and S. Witte (Stefan)
February 2023
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Molecular Probing of the Stress Activation Volume in Vapor Phase Lubricated Friction Article
ACS Appl. Mater. Interfaces, 15(9), 12603-12608.C.-C. Hsu (Chao-Chun), L. Peng (Liang), F.-C. Hsia (Feng-Chun), B. Weber (Bart), D. Bonn (Daniel) and A.M. Brouwer (Albert)
February 2023
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February 2023 -
Evidence of production of keV Sn<sup>+</sup> ions in the H<sub>2</sub> buffer gas surrounding an Sn-plasma EUV source Article
Plasma Sources Sci. Technol., 32(3), 035006: 1-9.S. Rai (Subam), K. Bijlsma (Klaas), L. Poirier (Lucas), E. de Wit (Emiel), L. Assink (Luc), A.C. Lassise (Adam), I. Rabadán (Ismanuel), L. Méndez (Luis), J. Sheil (John), O.O. Versolato (Oscar), et al. R. Hoekstra (Ronnie)
March 2023
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A force controlled tribometer for pre-sliding measurements at the nanometer scale Article
Front. Mech. Eng., 1019979: 1-7.March 2023
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Capillary adhesion governs the friction behavior of electrochemically corroded polycrystalline diamond Article
Carbon, 345-352.C. Xiao (Chen), L. Peng (Liang), C. Leriche (Cyrian), F.-C. Hsia (Feng-Chun), B. Weber (Bart) and S.E. Franklin (Steve)
March 2023