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Methods and Applications of Extreme Ultraviolet Multi-Wavelength Ptychography in Nanoscale Imaging Dissertation
EUV Generation & ImagingDecember 2025 -
Optical Metasurfaces for Information Efficient Nanoscale Metrology Dissertation
Project AMOLF/ARCNLDecember 2025 -
Dynamic nonlinear light control and metrology with resonant metasurfaces Dissertation
Project AMOLF/ARCNLDecember 2025 -
Ion emission properties of tin plasmas generated by 2 µm-wavelength laser pulses Article
Plasma Sources Sci. Technol., 34(12), 125013: 1-10.S.J.J. de Lange (Stan Johannes), J. Gonzales (Jorge), D.J. Engels (Dion), F.M. Kohlmeier (Felix) and J. Sheil (John)
December 2025
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Laser-induced plasma formation on free-flying liquid tin sheets Article
Phys. Plasmas, 33(1), 013507: 1-9.H.K. Schubert (Hermann Karl), R.A. Meijer (Randy Anthonius), B. Liu (Bo), D.J. Engels (Dion) and O.O. Versolato (Oscar)
January 2026
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Extreme ultraviolet induced reactions of tin–oxo cage photoresists Article
J. Mater. Chem. CN. Sadegh (Najmeh), J. Haitjema (Jarich), Y. Zhang (Yu), L. Wu (Lianjia), O.C.M. Lugier (Olivier), I. Bespalov (Ivan), D. Kazazis (Dimitrios), M. Vockenhuber (Michaela), Y. Ekinci (Yasin), K. Witte (Katharina), et al. B. Watts (Benjamin), I. Pollentier (Ivan), D. De Simone (Danilo) and A.M. Brouwer (Albert)
January 2026
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Adhesion Control Through Electric Field-Induced Water Adsorption at Oxidized Silicon Interfaces Article
Tribol. Lett., 74(1), 4: 1-10.H.T. Çiftçi (Tunç), J. Cottom (Jonathon), R. Hahury (Rachid), E. Olsson (Emilia) and B. Weber (Bart)
January 2026
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Vision Transformer network for optical overlay metrology on semiconductor wafers Article
APL Mach. Learn., 4(1), 016101: 1-10.L. de Wolf, M. Lipp (Maximilian), M. Cochez, A.J. den Boef (Arie) and L.V. Amitonova (Lyubov)
January 2026