aPIE: Angle calibration algorithm for reflection ptychography

de Beurs, Anne; Loetgering, Lars; Herczog, Milan; Eikema, Kjeld; Witte, Stefan

doi:10.1364/cosi.2021.cw6b.4

A.C.C. de Beurs (Anne), L. Loetgering (Lars), M. Herczog (Milan), K.S.E. Eikema (Kjeld) and S. Witte (Stefan)

2021-07-23

aPIE: Angle calibration algorithm for reflection ptychography

We demonstrate a tilt angle self-calibration technique for reflection mode ptychography. Experiments show accurate angle retrieval and improved image reconstruction, with spatially structured beams outperforming beams with smooth profiles

Additional Metadata
Publisher	OSA Technical Digest (Optical Society of America)
Persistent URL	doi.org/10.1364/cosi.2021.cw6b.4
Organisation	EUV Generation & Imaging
Citation APA Style AAA Style APA Style Cell Style Chicago Style Harvard Style IEEE Style MLA Style Nature Style Vancouver Style American-Institute-of-Physics Style Council-of-Science-Editors Style BibTex Format Endnote Format RIS Format CSL Format DOIs only Format	de Beurs, A., Loetgering, L., Herczog, M., Eikema, K., & Witte, S. (2021). aPIE: Angle calibration algorithm for reflection ptychography. In OSA Imaging and Applied Optics Congress 2021 (3D, COSI, DH, ISA, pcAOP), paper CW6B.4. doi:10.1364/cosi.2021.cw6b.4

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