2026-08-28
Formation and compaction of sub-10 nm transfer films in metal–ceramic fretting
Publication
Publication
Beilstein J. Nanotechnol. , Volume 2026 - Issue 17 p. 1200- 1211
Nanoscale transfer in metal–ceramic fretting originates at microcontacts but has remained experimentally unresolved. Here, we use an atomic force microscopy-based topographical difference method to visualize the formation of sub-10 nm transfer films at a sapphire–chromium interface subjected to fretting. Transfer proceeds via adhesive wear of chromium at micrometer-scale contacts, followed by plastic compaction of the chromium debris into a conformal ≈5 nm transfer film. Excess debris is expelled from the circular contact and accumulates in a curvature-defined peripheral ring around the contact. These results connect microcontact fracture, debris evolution, and nanoscale transfer-film formation in fretting contacts.
| Additional Metadata | |
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| Beilstein Institut | |
| ASML, ARCNL, VU, UvA, RUG, NWO | |
| doi.org/10.3762/bjnano.17.83 | |
| Beilstein J. Nanotechnol. | |
| Organisation | Contact Dynamics |
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Çiftçi, T., Şahin, O., Roch, T.& Weber, B. (2026). Formation and compaction of sub-10 nm transfer films in metal–ceramic fretting. Beilstein J. Nanotechnol., 2026(17), 1200–1211.https://doi.org/10.3762/bjnano.17.83 |
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