2020-02-07
Measuring laser beam quality, wavefronts, and lens aberrations using ptychography
Publication
Publication
Opt. Express , Volume 28 - Issue 4 p. 5022- 5034
We report on an approach for quantitative characterization of laser beam quality, wavefronts, and lens aberrations using ptychography with a near-infrared supercontinuum laser. Ptychography is shown to offer a powerful alternative for both beam propagation ratio M2 and wavefront measurements compared with existing techniques. In addition, ptychography is used to recover the transmission function of a microlens array for aberration analysis. The results demonstrate ptychography’s flexibility in wavefront metrology and optical shop testing.
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| NWO , ERC | |
| doi.org/10.1364/oe.385191 | |
| Opt. Express | |
| Organisation | EUV Generation & Imaging |
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Du, M., Loetgering, L., Eikema, K., & Witte, S. (2020). Measuring laser beam quality, wavefronts, and lens aberrations using ptychography. Opt. Express, 28(4), 5022–5034. doi:10.1364/oe.385191 |
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